Bojiong (Shanghai) Precision Machinery Technology Co., Ltd
Bojiong (Shanghai) Precision Machinery Technology Co., Ltd
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AOI150 Optical Component Surface Defect Detector
  • AOI150 Optical Component Surface Defect DetectorAOI150 Optical Component Surface Defect Detector

AOI150 Optical Component Surface Defect Detector

In response to the needs of enterprise production line automation upgrades, BOJIONG has introduced a new machine vision product AOI150 Optical Component Surface Defect Detector. This device is capable of automated, high-speed, and high-precision detection of glass defects, effectively solving the problems of low efficiency and poor accuracy associated with manual visual inspection. It is suitable for quality control of surface defects on mobile phone screens and display screens.Any inquiries and problems please feel free to send emails to us and we will reply you soon.

AOI150 Optical Component Surface Defect Detector has a detection resolution of up to 0.5 micrometers and a maximum inspection aperture of 150mm by 150mm. The device is capable of automatically generating reports, with report formats that include the U.S. Military Standard MIL-PRF-13830A/B and the International Standard ISO10110-7.

 

Item Specification:


product name

Zer AOI150 Optical Component Surface Defect Detector

Maximum detection size

150mm by 150mm

Detection resolution

0.5μm

Detection method

Dark field array scanning imaging

Output reports

National standards, U.S. military standards, and customized enterprise reports.

 

Feature Of BOJIONG Zer AOI150 Optical Component Surface Defect Detector



AOI150 Optical Component Surface Defect Detector uses machine vision technology to achieve automated, high-speed, and high-precision detection of defects on glass and metal surfaces, effectively solving the problems of low efficiency and poor accuracy in visual inspection. The highest detection resolution can reach 0.5μm, and the maximum detection aperture can be as large as 150mm by 150mm. The imaging employs annular illumination and micro-scatter dark field imaging. The device can automatically output reports, with report formats including the U.S. Military Standard MIL-PRF-13830A/B and the International Standard ISO 10110-7.


AOI150 Optical Component Surface Defect Detector Application Fields



Suitable for quality control of surface defects in optical components, optical window wafers, silicon wafers, sapphire wafers, etc.

This equipment can handle the following types of defects:

Polishing defects: scratches, pits, chipping, bubbles, dirt, etc.

Coating defects: delamination, damage to the coating, etc.

◆ Multi-beam annular illumination

◆ Variable magnification imaging with high and low magnification options

◆ Detection accuracy of 0.5 μm

◆ Whole-plate multi-wafer detection

◆ Linear motor for rapid imaging

◆ Equipped with an FFU (Fan Filter Unit) to ensure internal cleanliness

Multi-beam annular imaging illumination



Automatic zoom microscope from 1X to 8X.


Adjustable rapid clamping for the entire plate.


High-precision 2D linear motors ensure the accuracy of rapid shooting.


AOI Intelligent Inspection Software



Military standard spreadsheet output

 

Test result display

Coating surface scratch.

 

Scratches

 

Laser damage spot 1

Laser damage spot 2

 

Nanoscale particulate point

 

Fiber

 

Component deliquescence

 

membrane layer damage


AOI150 Optical Component Surface Defect Detector parameter

 

AOI150 Optical Component Surface Defect Detector

Item

Description

Model

AOI150

Equipment Function

Quantitative defect detection for ultra-smooth surface planar optical components, and output of electronic reports according to the detection results such as U.S. Military Standard, National Standard, and International Standard.

Maximum Detection Size

150mm × 150mm

Detection Precision

Low magnification 5μm, high magnification 0.5μm

Clamping Method

Whole plate clamping or single piece clamping, supporting square and round piece clamping.

Leveling Method

Whole plate material assisted automatic focusing, electric leveling.

Imaging Method

Annular illumination, micro-scatter dark field imaging, in accordance with the "Quantitative Detection Method for Surface Defects of Optical Components—Micro-scatter Dark Field Imaging Method" described in the national standard GB/T 41805-2022.

Detection Method

Low magnification scanning stitching, high magnification positioning quantification.

Scanning Mechanism

2D linear motor, stroke 150mm × 150mm.

Camera Parameters

Large target camera, 5 million pixels.

Report Format

Excel, Word format, U.S. Military Standard, National Standard, International Standard, or enterprise statistical report.

Industrial PC Config

i7 processor, 32GB memory, 1T hard disk, 6GB video memory.

Equipment Dimensions

900mm × 800mm × 2000mm (L × W × H)

Power Supply Voltage

220V ± 10%

 

 

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