FIS4 near-infrared wavefront sensor (Refrigerated version) 900-1200nm

FIS4 Near-Infrared wavefront sensor (Refrigerated version) 900-1200nm

The Bojiong FIS4 Near-Infrared wavefront sensor (Refrigerated version) 900-1200nm is designed for demanding infrared optical applications. It integrates a high-precision semiconductor cooling system on the FIS4 near-infrared wavefront sensor. This actively stabilizes the core detector temperature below -10°C ambient, significantly suppressing dark current and thermal noise, and achieving an ultra-high measurement stability of 2nm RMS. Covering the 900–1200nm near-infrared band, the sensor boasts an ultra-high 512×512 spatial resolution and a wide dynamic range of ≥260μm, enabling clear analysis of the wavefront distortion and phase distribution of high-power lasers, metasurface devices, and silicon-based semiconductors in the infrared.

Bojiong FIS4 Near-Infrared wavefront sensor (Refrigerated version) 900-1200nm Introduction

The Bojiong FIS4 Near-Infrared wavefront sensor (Refrigerated version)900-1200nm is our company's new generation of high-precision optical inspection equipment, featuring excellent vibration resistance and real-time wavefront measurement capabilities. The FIS4 Near-Infrared wavefront sensor (Refrigerated version) 900-1200nm adheres to the strict ISO 9001 quality management system and is certified by the China Institute of Metrology (NIM). It comes with a one-year warranty. The FIS4 Near-Infrared wavefront sensor (Refrigerated version)900-1200nm utilizes a common-path interferometric optical design and a real-time wavefront reconstruction algorithm to achieve high-precision wavefront measurement without phase shifting, making it suitable for a variety of demanding scientific research and industrial applications.

Bojiong FIS4 Near-Infrared wavefront sensor (Refrigerated version) 900-1200nm Parameter (Specification)

Bojiong FIS4 Near-Infrared wavefront sensor (Refrigerated version) 900-1200nm Feature And Application

Since 2006, Professor Yang Yongying's team at Zhejiang University has successfully developed the wide-spectrum FIS4 series wavefront sensor, based on a common-path interferometer structure and real-time wavefront reconstruction algorithms. After 17 years of continuous research, this product offers the following key advantages:

· Excellent vibration resistance, no vibration isolation platform required;

· Nanometer-level sensitivity, with wavefront measurement sensitivity reaching up to 2 nm RMS;

· Integrated single-optical path design, innovatively using a single-optical path structure, no reference optical path needed;

· User-friendly operation;

· Compact and portable, easy to carry around, suitable for various on-site integrations and applications

The FIS4 series wavefront sensor is designed for high-precision optical inspection and measurement, suitable for industrial inspection, scientific research, and defense applications. With a high resolution of 512×512 (262,144) phase points, the sensor achieves high-precision wavefront measurement across a wide spectral range of 900–1200 nm and supports real-time 3D display at 10 frames per second at full resolution. Typical applications include optical system aberration analysis, optical calibration, material internal lattice distribution detection, metasurface and metalens wavefront characterization, etc., providing reliable tools for high-end optical measurement.

Bojiong FIS4 Near-Infrared wavefront sensor  Application

Bojiong FIS4 Near-Infrared wavefront sensor (Refrigerated version) 900-1200nmDetails

The FIS4 Near-Infrared wavefront sensor (Refrigerated version) 900-1200nm utilizes patented random coded four-wave diffraction technology, leveraging a single-path light source to achieve self-interference of the measured wavefront, with interference occurring at the rear image plane. This technology significantly reduces reliance on light source coherence, eliminating the need for a phase shifter and enabling high-precision interferometry when combined with a standard imaging system. Compared to traditional Hartmann sensors based on microlens arrays, the FIS4 Near-Infrared wavefront sensor (Refrigerated version)900-1200nmoutperforms traditional dual-beam interferometers, offering significant performance advantages in multiple areas: higher-resolution phase points, wider operating band adaptability, and greater dynamic range, all while offering superior cost-performance, providing a reliable solution for a wide range of precision optical inspection applications.

Fig.1.Phase imaging principle based on four-wave lateral shearing interference using randomly coded hybrid grating (REHG)

Fig.2.Least square wavefront reconstruction from four-wave lateral shearing interferogram

The FIS4 wavefront sensor, combining compactness, high stability, excellent temporal resolution, and excellent system compatibility, has become a core tool in scientific research and industrial testing. The FIS4 wavefront sensor used in optical workshops for basic testing such as optical component quality analysis, laser beam diagnostics, and adaptive optics control, its applications have now expanded to include biological microscopy, nanoparticle tracking, metasurface measurement, and thermodynamic characterization. FIS4 wavefront sensor compact design allows for easy integration into existing microscopy systems, and its excellent vibration tolerance ensures accurate measurements even in harsh environments. Its single-exposure imaging capability is particularly well-suited for recording fast dynamic processes. In biomedical research, FIS4 wavefront sensor has enabled label-free, high-resolution, real-time observation of various living cells (such as COS-7, HT1080, RPE, CHO, HEK, and neurons). Furthermore, the FIS4 wavefront sensor supports high-contrast phase-delay imaging, clearly demonstrating anisotropic structures such as collagen fibers and the cytoskeleton. Phase imaging has been extended to X-ray, mid-infrared, and long-infrared wavelengths, demonstrating its value in metasurface and two-dimensional material analysis.