FIS4 NIR-C Wavefront Sensor

Our FIS4 NIR-C Wavefront sensors  are expertly designed to rigorously meet the demanding standards of high-precision optical analysis, furnishing our clientele with a dependable instrument to guarantee the superior caliber of their products and operational methodologies.  By seamlessly integrating these sensors into their operational frameworks, our customers can confidently anticipate a significant advancement in both product excellence and manufacturing efficiency.

The outstanding high resolution and extensive wavelength coverage of the BOJIONG FIS4 NIR-C Wavefront sensor position it as an unparalleled tool for both scientific inquiry and industrial implementation, particularly in scenarios that necessitate meticulous measurement and stringent analysis.  This sophisticated sensor excels at conducting high-precision wavefront measurements spanning the 900nm to 1200nm wavelength range, boasting a remarkable 512x512 pixel resolution—amounting to a total of 262,144 distinct phase points.  Its design thoughtfully integrates inherent vibration resistance and ensures robust stability in practical settings, facilitating high-fidelity measurements without requiring cumbersome environmental control systems.  This intrinsic resilience markedly optimizes operational workflows and significantly elevates overall measurement throughput.

Specification ：

Feature

◆ 100% domestically developed

◆ Single-path light self-interference, no reference light required

◆ Large dynamic range up to 260 μ m

◆ Wide spectrum 900nm~1200nm band

◆ 2nm RMS high phase resolution

◆ Extremely strong vibration resistance, no need for optical vibration isolation

◆ With laser interference fringe suppression design

◆ Support collimated beams and large NA converging beams

◆ Using semiconductor refrigeration

 Application

This BOJIONG FIS4 NIR-C  Wavefront sensor  used in optical system aberration measurement, optical system calibration, material internal lattice distribution measurement, hypersurface, hyperlens wave front measurement

BOJIONG Details

Bojiong FIS4 NIR-C  (semiconductor cooling) wavefront sensor was developed by a team of professors from Zhejiang University and Nanyang Technological University, Singapore. It has an ultra-high resolution of 512 × 512 (262144) phase points, and can achieve high-precision wavefront measurement in the 900nm1200nm band. It can be used for optical system aberration measurement, optical system calibration, material internal lattice distribution measurement, metasurface, superlens wavefront measurement, etc.

FIS4 NIR-C  combines the patented random coded four-wave diffraction technology with an infrared camera, and interferes at the rear image plane position. It has low requirements for light source coherence and does not require phase shifting. Ordinary imaging systems can achieve interferometric measurement. It has ultra-high vibration resistance and ultra-high stability, and can achieve nm-level precision measurement without vibration isolation.