It can quickly replace the object under test and is easy to adjust. The Horizontal Planar Dynamic Interferometer features a four-wavefront transverse shear common-path interferometer with a variable shear rate. The interferometer system has a compact structure and stable interference fringes. The system utilizes self-interfering wavefront technology to detect distortions in parallel planes and transmitted wavefronts, making it particularly suitable for on-site quality inspection in the workshop. The equipment offers a high cost-performance ratio.
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product name |
Horizontal Planar Dynamic Interferometer |
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Detectable sample aperture (mm) |
Up to 100, there are two interchangeable aperture sizes of 40 and 100 |
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CCD pixels |
2048*2048 |
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Wavelength (nm) |
633±10 |
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Dynamic range (um) |
100 |
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Precision PV value (λ) |
Better than 1/10 wavelength |
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RMS measurement repeatability (λ) |
1/1000 wavelength |
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Sensitivity (nm) |
2 |
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Real time display frame rate (Hz) |
15 |
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The system is equipped with random equipment |
Image processing computer |
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Processing software |
The software "Industrial Window Component Distortion Detection Instrument" can display real-time output wavefront values such as PV value, RMS value, and POWER value |
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Overall dimensions (including sample stage) (mm) |
600 (length) x 300 (width) x 180 (height) |
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Total weight (KG) |
30 |
◆Good real-time performance, able to achieve dynamic detection of dozens of frames
◆Common path self interference - no reference plane required
◆Good vibration resistance, no need for isolation platforms, can be applied for testing in ordinary workshop environments
◆Good cost-effectiveness, simple adjustment, and compact structure
The BOJIONG Horizontal Planar Dynamic Interferometer was compared with the results obtained from the ZYGO GPI interferometer, which is currently commonly used internationally. The average values of PV, RMS, and POWER for the same component were calculated after being measured separately in two devices, and the results were consistent. The equipment has been applied to the workshop site.
◆Beam quality detection and transient wavefront detection
◆Optical flat panel components, sapphire substrates, precision metal surfaces, and other surface shapes, as well as transmission wavefront detection
◆Bioquantitative phase microscopy imaging
◆Detection of distortion of flat glass in smartphones and high-definition monitoring windows
◆Can be used for high-precision optical system image quality detection
◆Detection of adaptive optical wavefront sensing and other aspects
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Transmission wavefront detection results of sapphire components |
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Surface shape detection of optical components |
BOJIONG developed the Horizontal Planar Dynamic Interferometer based on the principle advantage of common path self interference of FIS4 four wave interferometric sensor. This device can perform real-time detection of the surface shape of planar optical elements within a 100mm aperture. The beam carrying the surface shape information of the measured element diffracts through a specially encoded grating, dividing the wavefront horizontally into four and forming a four wavefront common path shearing two-dimensional interference pattern. By demodulating the two-dimensional interference, the surface shape information of the element is obtained.
◆Equipped with the "Horizontal Planar Dynamic Interferometer" software, it can display and output real-time 3D images of the measured optical element plane, output PV values, RMS values, and POWER values of the measured surface.
◆At the same time, the software supports exporting raw data of measurement results, providing quantitative detection data support for various studies, and facilitating users to conduct data analysis and research in the future.
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