FIS4 ultra-high-resolution wavefront sensor (Refrigerated version) 400-900nm

FIS4 ultra-high-resolution wavefront sensor (Refrigerated version) 400-900nm

The Bojiong FIS4 UHR-C wavefront sensor 400-900nm , building on the existing UHR series, integrates a high-efficiency semiconductor cooling system, significantly reducing the sensor's thermal noise under long-term, high-frame-rate operation. Leveraging 512×512 ultra-high-density phase detection points and precise temperature control, it maintains measurement stability better than 1.5nm RMS in ambient temperatures ranging from -10°C to 45°C, making it particularly suitable for demanding applications such as high-power laser detection, long-term online monitoring, and ultra-fine wavefront diagnostics. The FIS4 UHR-C wavefront sensor  supports 5 frames/second real-time output of all parameters and features multi-band adaptive analysis capabilities, providing reliable high-dynamic, low-noise measurement support for precision optical manufacturing and cutting-edge scientific research.

Bojiong FIS4 UHR-C wavefront sensor 400-900nm Introduction

The Bojiong FIS4 ultra-high-resolution wavefront sensor (Refrigerated version) 400-900nm is our company's new flagship optical measurement instrument, offering superior performance and reliable quality. It adheres to the strict ISO 9001 quality management system and is certified by the China National Institute of Metrology (NIM) for traceability. It comes with a one-year warranty, ensuring the accuracy and reliability of measurement data. This sensor utilizes a proprietary common-path interferometric optical system and real-time wavefront decomposition system, eliminating traditional phase shifters and reference mirrors. This system operates stably in high-vibration environments, enabling 512×512 ultra-high-resolution wavefront measurements. With an ultra-high measurement accuracy of 2 nm RMS, a wide dynamic range of ≥160 μm, and a 5-frame/second real-time output of all parameters, the FIS4 ultra-high-resolution wavefront sensor (Refrigerated version) 400-900nmaccurately captures transient wavefront changes and high-order aberrations. The FIS4 UHR-C wavefront sensor  is widely applicable to laser beam wavefront measurement, adaptive optics, planar surface measurement, optical system calibration, optical window inspection, optical spherical surface measurement, surface roughness inspection, and surface micro-profiling.

Bojiong FIS4 UHR-C wavefront sensor 400-900nm Parameter (Specification)

Bojiong FIS4 UHR-C wavefront sensor 400-900nm Feature And Application

Since 2006, Professor Yang Yongying's team at Zhejiang University has been working on common-path interferometry design and real-time wavefront reconstruction algorithms for 17 years. The team has successfully launched the wide-spectrum FIS4 series wavefront sensor, marking a major breakthrough in my country's high-precision optical sensing field.

This FIS4 ultra- high-resolution wavefront sensor (Refrigerated version) utilizes an innovative single-optical-path architecture, eliminating the need for a reference optical path or phase shifter, enabling a truly plug-and-play experience. Its exceptional performance is demonstrated in multiple dimensions: stable operation without a vibration isolation platform, capturing high-precision wavefront data in real time; high sensitivity of 2 nm RMS and a resolution of 512×512 (262,144 phase points) enable clear visualization of microscopic details in the object under test; and, in a compact, fist-sized package, it boasts a wide spectral response of 400-900 nm and delivers full-resolution, real-time 3D wavefront display at 5 frames per second. The FIS4 series is designed for demanding scientific research and precision industrial inspection scenarios. It can accurately serve multiple high-end fields such as laser beam quality analysis, adaptive optics system debugging, plane/spherical optical component surface measurement, optical system alignment and calibration, optical window inspection, and surface roughness and micro-profile characterization, providing an ideal core measurement tool for modern optical measurement.

Bojiong FIS4 UHR-C wavefront sensor 400-900nm Application

Bojiong FIS4 UHR-C wavefront sensor 400-900nm Details

The FIS4 ultra-high-resolution wavefront sensor (Refrigerated version) 400-900nm is based on a unique patented random coded four-wave diffraction technology, which can achieve wavefront self-interference in a single optical path, and the interference effect is directly formed on the rear-end image plane. This system significantly reduces the dependence on the coherence of the light source and can complete high-precision interference measurement in conjunction with a conventional imaging unit without the need for a phase shifter. The FIS4 wavefront sensor has excellent vibration resistance and operational stability, and can stably achieve nanometer-level wavefront measurement even without a vibration isolation device. Compared with traditional microlens array-type Hartmann sensors, the FIS4 wavefront sensor can provide denser phase point sampling, a wider spectral adaptation range, and a higher dynamic measurement upper limit, while maintaining a more competitive cost-effectiveness, making it an ideal solution for demanding optical measurement scenarios.

Fig.1.Phase imaging principle based on four-wave lateral shearing interference using randomly coded hybrid grating (REHG)

Fig.2.Least square wavefront reconstruction from four-wave lateral shearing interferogr

The FIS4 wavefront sensor, with its highly integrated design, exceptional environmental adaptability, superior temporal resolution, and wide system compatibility, has become a groundbreaking innovation in optical metrology. This product not only demonstrates great potential in scientific research but has also earned high recognition in industrial applications. Initially used for precision inspection in traditional optical workshops, the FIS4 wavefront sensor has successfully served specialized fields such as optical component surface testing, laser beam quality analysis, and adaptive optics system calibration. Its application has now expanded to include cutting-edge research areas such as biomedical imaging, nanoparticle tracking, metasurface structure characterization, and temperature field monitoring, demonstrating its strong interdisciplinary capabilities.

Thanks to its compact mechanical design, the FIS4 wavefront sensor can be easily integrated into various microscopy imaging systems and complex optical platforms. Its innovative architecture, based on the principle of common-path interferometry, enables the device to maintain nanometer-level measurement accuracy even in high-vibration environments, ensuring stable operation without the need for additional vibration isolation devices. The sensor also features single-exposure wavefront reconstruction, enabling accurate capture of high-speed dynamic processes such as fluid motion, particle transients, and laser transmission, and providing precise quantitative analysis.

In biomedical research, the FIS4 system has successfully achieved label-free, long-term, three-dimensional quantitative phase imaging of a variety of living cells (including COS-7, HT1080, RPE, CHO, HEK, and primary neurons), significantly reducing phototoxicity and providing a novel technical approach for studying cell dynamics. The system's phase-delay imaging capability also enables high-contrast imaging of birefringent structures such as collagen fibers and the cytoskeleton, significantly advancing research in tissue mechanics and pathology.

Notably, the FIS4 wavefront sensor's technical architecture demonstrates significant cross-band scalability. Its design principles have been successfully applied to the development of phase imaging systems in the X-ray, mid-wave infrared (MWIR), and long-wave infrared (LWIR) bands, providing innovative measurement solutions for materials science, thermal management, and national defense security. In recent years, the sensor has also found widespread application in emerging fields such as metasurface phase manipulation evaluation and characterization of the optical properties of two-dimensional materials, demonstrating its significant value and broad applicability as a fundamental research tool.