Bojiong (Shanghai) Precision Machinery Technology Co., Ltd
Bojiong (Shanghai) Precision Machinery Technology Co., Ltd
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AOI450 Optical Component Surface Defect Detector
  • AOI450 Optical Component Surface Defect DetectorAOI450 Optical Component Surface Defect Detector

AOI450 Optical Component Surface Defect Detector

With the advent of artificial intelligence and the urgent global demand for automation upgrades, the AOI450 Optical Component Surface Defect Detector has been designed to meet customers' diverse needs for automation. This device is capable of automatic, high-speed, and high-precision detection of optical components and optical window panes, effectively solving the problems of low efficiency and poor accuracy associated with manual visual inspection. It is suitable for quality control of surface defects on mobile phone screens and display screens. For any inquiries and issues, please feel free to send us an email at any time, and we will respond to you as soon as possible.

The AOI450 Optical Component Surface Defect Detector is capable of inspecting optical components and optical window panes. It boasts a detection resolution of up to 0.5 micrometers and a maximum inspection aperture of 450mm by 450mm. The device can automatically output reports, with formats that include the U.S. Military Standard MIL-PRF-13830A/B and the International Standard ISO10110-7.

 

Item Specification:


product name

AOI450 Optical Component Surface Defect Detector

Maximum detection size

450mmX450mm

Detection resolution

0.5μm

Detection method

Dark field array scanning imaging

Output reports

National standards, U.S. military standards, and customized enterprise reports.

 

Feature Of BOJIONG AOI450 Optical Component Surface Defect Detector



The AOI450 Optical Component Surface Defect Detector utilizes machine vision technology to achieve automated, high-speed, and high-precision detection of surface defects on optical components and optical window panes, effectively addressing the issues of low efficiency and poor accuracy in visual inspection. The highest detection resolution can reach 0.5 micrometers, and the maximum detection aperture can be as large as 450mm by 450mm. The imaging technology used includes annular illumination and micro-scatter dark field imaging. The device is capable of automatically generating reports, with formats that include the U.S. Military Standard MIL-PRF-13830A/B and the International Standard ISO 10110-7.


AOI450 Optical Component Surface Defect Detector Application Fields




Suitable for quality control of surface defects in optical components, optical window wafers, silicon wafers, sapphire wafers, etc.

Polishing defects: scratches, pits, chipping, bubbles, dirt, etc.

This equipment can handle the following types of defects:

Coating defects: delamination, damage to the coating, etc.



◆ Multi-beam annular illumination

◆ Variable magnification imaging with high and low magnification options

◆ Detection accuracy of 0.5 μm

◆ Whole-plate multi-wafer detection

◆ Linear motor for rapid imaging

◆ Equipped with an FFU (Fan Filter Unit) to ensure internal cleanliness

Multi-beam annular imaging illumination



Automatic zoom microscope from 1X to 8X.


Adjustable rapid clamping for the entire plate.


High-precision 2D linear motors ensure the accuracy of rapid shooting.


AOI Intelligent Inspection Software




Military standard spreadsheet output


Test result display




Coating surface scratch.

 

Scratches

 

Laser damage spot 1

Laser damage spot 2

 

Nanoscale particulate point

 

Fiber

 

Component deliquescence

 

membrane layer damage


AOI450 Optical Component Surface Defect Detector parameter

 

AOI450 Optical Component Surface Defect Detector

Item

Description

Model

AOI450

Equipment Function

Quantitative defect detection for ultra-smooth surface planar optical components, and output of electronic reports according to the detection results such as U.S. Military Standard, National Standard, and International Standard.

Maximum Detection Size

450mmX450mm

Detection Precision

Low magnification 5μm, high magnification 0.5μm

Clamping Method

Whole plate clamping or single piece clamping, supporting square and round piece clamping.

Leveling Method

Whole plate material assisted automatic focusing, electric leveling.

Imaging Method

Annular illumination, micro-scatter dark field imaging, in accordance with the "Quantitative Detection Method for Surface Defects of Optical Components—Micro-scatter Dark Field Imaging Method" described in the national standard GB/T 41805-2022.

Detection Method

Low magnification scanning stitching, high magnification positioning quantification.

Scanning Mechanism

2D linear motor, stroke 150mm × 150mm.

Camera Parameters

Large target camera, 5 million pixels.

Report Format

Excel, Word format, U.S. Military Standard, National Standard, International Standard, or enterprise statistical report.

Industrial PC Config

i7 processor, 32GB memory, 1T hard disk, 6GB video memory.

Equipment Dimensions

900mm × 800mm × 2000mm (L × W × H)

Power Supply Voltage

220V ± 10%

 

 

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