Near-Infrared Wavefront Analyzer

The Near-Infrared Wavefront Analyzer is a cutting-edge device for measuring and calibrating optical systems' aberrations. It specializes in high-precision wavefront measurements within the 900-nanometer to 1200-nanometer wavelength range. This instrument offers clients accurate solutions for optical performance measurement and analysis, contributing to the improvement of product quality and production efficiency. Over recent years, we have been expanding our production capabilities, enhancing our technical strength, and establishing a robust corporate operational framework. Hope to build business relationship with you.

Send Inquiry

Product Description

The Near-Infrared Wavefront Analyzer that combines the patented technology of random coded four-wave diffraction with an infrared camera allows for interference measurement to be conducted by ordinary imaging systems. It boasts an exceptionally high level of vibration resistance and stability, enabling nanometer-level precision measurement without the need for vibration isolation. It is suitable for measuring the internal lattice distribution of materials, as well as for wavefront measurements of metasurfaces and hyperlenses.

Item Specification:

Product name	Near-Infrared Wavefront Analyzer
Wavelength range	900nm~1200nm
Target size	13.3mm×13.3mm
Spatial resolution	26μm
Sampling resolution	512×512（262144pixel）
Phase resolution	＜2nmRMS
Absolute accuracy	15nmRMS
Dynamic range	270μm（256λ）
Sampling rate	45fps
Real-time processing speed	10Hz（Full resolution）
Interface type	USB3.0
Dimension	70mm×46.5mm×68.5mm
Weight	about 240g

Feature Of BOJIONG Near-Infrared Wavefront Analyzer

◆Broad spectrum 900nm~1200nm band

◆2nm RMS high phase resolution

◆Ultra-high resolution of 512×512 (262144) phase points

◆Single-channel light self-interference, no reference light required

◆Large dynamic range up to 270μm

◆Extremely strong anti-vibration performance, no need for optical vibration isolation

◆Just like imaging, easy and fast optical path construction

◆Supports collimated beams and large NA converged beams

Application Of BOJIONG Near-Infrared Wavefront Analyzer

This BOJIONG Near-Infrared Wavefront Analyzer used in optical system aberration measurement, optical system calibration, material internal lattice distribution measurement, hypersurface, hyperlens wave front measurement

Example of aberration measurement of optical system

Sample measurement of lattice distribution inside a material

Optical system calibration measurement examples

Example of metasurface wavefront measurement

Example of hyperlens wavefront measurement

BOJIONG Near-Infrared Wavefront Analyzer Details

BOJIONG Near-Infrared Wavefront Analyzer developed by a team of professors from Zhejiang University and Nanyang Technological University of Singapore, with domestic patented technology, it combines diffraction and interference to achieve a common four-wave transverse shear interference, with superior detection sensitivity and anti-vibration performance, and can realize real-time and high-speed dynamic interferometry without vibration isolation. The real-time measurement shows a frame rate of more than 10 frames. At the same time, the FIS4 sensor has an ultra-high phase resolution of 512×512 (260,000 phase points), the measurement band covers 200nm~15μm, the measurement sensitivity reaches 2nm, and the measurement repeatability is better than 1/1000λ (RMS). It can be used for laser beam quality analysis, plasma flow field detection, real-time measurement of high-speed flow field distribution, image quality evaluation of optical system, microscopic profile measurement and quantitative phase imaging of biological cells.

FIS4 Technical parameters of each series of products

Product	FIS4-UV	FIS4-HR	FIS4-UHR	FIS4-HS	FIS4-Cell	FIS4-NIR
Wavelength range	200~450nm	400~1100nm	400~1100nm	400~1100nm	400~1100nm	900~1200nm
Target size mm²	13.3×13.3	7.07×7.07	13.3×13.3	10.24×10.24	7.07×7.07	13.3×13.3
Spatial resolution	26μm	23.6μm	26μm	24.4μm	23.6μm	26μm
Image pixel	-	2048×2048	-	-	2048×2048	-
Phase output resolution	512×512 （262144pixel）	300×300（90000pixel）	512×512（262144pixel）	420×420（176400pixel）	300×300（90000pixel）	512×512（262144pixel）
Phase resolution	＜2nmRMS	＜2nmRMS	＜2nmRMS	＜2nmRMS	＜2nmRMS	＜2nmRMS
Absolute accuracy	10nmRMS	10nmRMS	15nmRMS	10nmRMS	10nmRMS	15nmRMS
Dynamic range	90μm （256λ）	110μm （150λ）	162μm （256λ）	132μm （210λ）	110μm （150λ）	270μm （256λ）
Sampling rate	32fps	24fps	45fps	107fps	24fps	45fps
Real-time processing speed	10Hz (Full resolution)	10Hz (Full resolution)	10Hz (Full resolution)	10Hz (Full resolution)Supports delayed batch processing	10Hz (Full resolution)	10Hz (Full resolution)
Interface type	USB3.0	GIGE	USB3.0	GIGE	GIGE	USB3.0
External interface	-	-	-	-	C port	-
Size mm²	70x46.5x68.5	56.5x43x41.5	70x46.5x68.5	56.5x43x41.5	56.5x43x41.5	70x46.5x68.5
weight	about240g	about120g	about240g	about120g	about120g	about240g

Hot Tags: Near-Infrared Wavefront Analyzer, China, Manufacturer, Supplier, Quality, Factory, Price, Advanced, Newest

Related Category

Send Inquiry

Contact Info



Address

No. 578 Yingkou Road, Yangpu District, Shanghai, China


Tel

+86-021-56729166


E-mail

tom.he@shbojiong.com

For inquiries about Interferometric Sensor, Wavefront Analyzer, Wavefront Sensor or price list, please leave your email to us and we will be in touch within 24 hours.