The Ultra High Resolution Wavefront Analyzer boasts excellent vibration resistance, ensuring reliable measurements even without the use of a vibration isolation platform. It achieves nanometer-level precision in data. It excels in the analysis of surface micro-profiles, with a super high resolution of 512×512, equating to 262,144 phase points, ensuring comprehensive coverage for detailed analysis. Its wide spectral response range from 400 to 1100 nanometers makes it suitable for various light sources. Additionally, it offers real-time 3D full-resolution result display at a rate of 10 frames per second, providing a dynamic and immediate view of the wavefront data. This makes it a comprehensive solution for wavefront sensing and measurement needs.
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Light source type |
Continuous laser ， Pulse laser ， LED, halogen lamp, and other broadband light sources |
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Wavelength range |
400nm~900nm |
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Target size |
13.3mm ×13.3mm |
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Spatial resolution |
26 μ m |
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Phase output resolution |
512×512 |
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Absolute accuracy |
15nmRMS |
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Phase resolution |
≤ 2nmRMS |
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Dynamic range |
≥160μ m |
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Sampling rate |
40fps |
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Real-time processing speed |
5Hz （ At full resolution ） |
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Interface type |
USB3.0 |
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Dimension |
70mm × 46.5mm ×68.5mm |
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Weight |
about240g |
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Refrigeration method |
none |
◆Ultra-high resolution of 512×512 (262144) phase points
◆Broad spectrum 400nm~1100nm band
◆Single-channel light self-interference, no reference light required
◆2nm RMS high phase resolution
◆Just like imaging, easy and fast optical path construction
◆ultra-high vibration resistance, no need for optical vibration isolation
◆Supports collimated beams and large NA converged beams
This BOJIONG Ultra High Resolution Wavefront Analyzer used in laser beam wavefront detection, adaptive optics, surface shape measurement, optical system calibration, optical window detection, optical plane, spherical surface shape measurement, surface roughness detection.
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laser beam wavefront detection |
Optical planar surface shape measurement |
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Optical spherical surface shape measurement |
Aberration measurement of optical systems |
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Optical window piece detection |
Measurement of lattice distribution inside the material |
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Adaptive optics - wavefront detection response in Zernike mode |
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BOJIONG Ultra High Resolution Wavefront Analyzer developed by a team of professors from Zhejiang University and Nanyang Technological University of Singapore, with domestic patented technology, it combines diffraction and interference to achieve a common four-wave transverse shear interference, with superior detection sensitivity and anti-vibration performance, and can realize real-time and high-speed dynamic interferometry without vibration isolation. The real-time measurement shows a frame rate of more than 10 frames. At the same time, the FIS4 sensor has an ultra-high phase resolution of 512×512 (260,000 phase points), the measurement band covers 200nm~15μm, the measurement sensitivity reaches 2nm, and the measurement repeatability is better than 1/1000λ (RMS). It can be used for laser beam quality analysis, plasma flow field detection, real-time measurement of high-speed flow field distribution, image quality evaluation of optical system, microscopic profile measurement and quantitative phase imaging of biological cells.
Address
No. 578 Yingkou Road, Yangpu District, Shanghai, China
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