Bojiong (Shanghai) Precision Machinery Technology Co., Ltd
Bojiong (Shanghai) Precision Machinery Technology Co., Ltd
Products
High Resolution Wavefront Analyzer
  • High Resolution Wavefront AnalyzerHigh Resolution Wavefront Analyzer

High Resolution Wavefront Analyzer

As a renowned manufacturer and supplier of High Resolution Wavefront Analyzer in China, BOJIONG Optoelectronics is dedicated to wavefront interference detection, having accumulated profound expertise and a commitment to providing unparalleled precision. Our state-of-the-art products and services have become the top choice for various industries, including optical manufacturing, aerospace, biomedical, and energy research. We offer our customers precise optical performance measurement and analysis to enhance product quality and production efficiency.
We warmly invite customers from around the globe to join us in partnership. Our goal is to establish collaborative relationships, ignite brilliance, and drive mutual success.


The High Resolution Wavefront Analyzer utilizes patented random coded four-wave diffraction technology, enabling the sensor to achieve self-interference in a single measured wavefront and to produce interference at the rear image plane position without the need for complex phase-shifting techniques. Due to its simple operation, ultra-high vibration resistance, and stability, BOJIONG's Analyzer provides an ideal wavefront sensing measurement solution, delivering nanometer-level precision measurements without the necessity for vibration isolation, significantly enhancing measurement efficiency and accuracy.

We will always adhere to the principle of "quality first, client first," and we cordially invite customers to visit us for consultation.

 

Item Specification

 

Product name

High Resolution Wavefront Analyzer

Wavelength range

400nm~1100nm

Target size

7.07mm×7.07mm

Spatial resolution

23.6μm

Image pixel

2048×2048

Phase output resolution

300×300(90000pixel)

Phase resolution

<2nmRMS

Absolute accuracy

10nmRMS

Dynamic range

110μm(150λ)

Sampling rate

24fps

Real-time processing speed

10Hz(At full resolution)

Interface type

GIGE

Dimension

56.5mm×43mm×41.5mm

Weight

about 120g


Feature Of BOJIONG High Resolution Wavefront Analyzer

 

 

 

◆Broad spectrum 400nm~1100nm band

◆High resolution of 300×300 (90000) phase points

◆ultra-high vibration resistance, no need for optical vibration isolation

◆Single-channel light self-interference, no reference mirror required

◆2nm RMS high phase resolution

◆Achieve simple and fast interference light path construction

◆Supports collimated beams and large NA converged beams

  

 Application Of BOJIONG High Resolution Wavefront Analyzer

 

This BOJIONG High Resolution Wavefront Analyzer used in laser beam wavefront detection, adaptive optics, surface shape measurement, optical system calibration, optical window detection, optical plane, spherical surface shape measurement, surface roughness detection

 

laser beam wavefront detection

Optical planar surface shape measurement

Optical spherical surface shape measurement

Aberration measurement of optical systems

Optical window piece detection

Measurement of lattice distribution inside the material

Adaptive optics - wavefront detection response in Zernike mode

 

 

 

BOJIONG High Resolution Wavefront Analyzer Details

 

BOJIONG High Resolution Wavefront Analyzer developed by a team of professors from Zhejiang University and Nanyang Technological University of Singapore, with domestic patented technology, it combines diffraction and interference to achieve a common four-wave transverse shear interference, with superior detection sensitivity and anti-vibration performance, and can realize real-time and high-speed dynamic interferometry without vibration isolation. The real-time measurement shows a frame rate of more than 10 frames. At the same time, the FIS4 sensor has an ultra-high phase resolution of 512×512 (260,000 phase points), the measurement band covers 200nm~15μm, the measurement sensitivity reaches 2nm, and the measurement repeatability is better than 1/1000λ (RMS). It can be used for laser beam quality analysis, plasma flow field detection, real-time measurement of high-speed flow field distribution, image quality evaluation of optical system, microscopic profile measurement and quantitative phase imaging of biological cells.


 

FIS4 Technical parameters of each series of products

 

Product

FIS4-UV

FIS4-HR

FIS4-UHR

FIS4-HS

FIS4-Cell

FIS4-NIR

Wavelength range

200~450nm

400~1100nm

400~1100nm

400~1100nm

400~1100nm

900~1200nm

Target size mm²

13.3×13.3

7.07×7.07

13.3×13.3

10.24×10.24

7.07×7.07

13.3×13.3

Spatial resolution

26μm

23.6μm

26μm

24.4μm

23.6μm

26μm

Image pixel

-

2048×2048

-

-

2048×2048

-

Phase output resolution

512×512

(262144pixel)

300×300(90000pixel)

512×512(262144pixel)

420×420(176400pixel)

300×300(90000pixel)

512×512(262144pixel)

Phase resolution

<2nmRMS

<2nmRMS

<2nmRMS

<2nmRMS

<2nmRMS

<2nmRMS

Absolute accuracy

10nmRMS

10nmRMS

15nmRMS

10nmRMS

10nmRMS

15nmRMS

Dynamic range

90μm

(256λ)

110μm

(150λ)

162μm

(256λ)

132μm

(210λ)

110μm

(150λ)

270μm

(256λ)

Sampling rate

32fps

24fps

45fps

107fps

24fps

45fps

Real-time processing speed

10Hz

(Full resolution)

10Hz

(Full resolution)

10Hz

(Full resolution)

10Hz

(Full resolution)Supports delayed batch processing

10Hz

(Full resolution)

10Hz

(Full resolution)

Interface type

USB3.0

GIGE

USB3.0

GIGE

GIGE

USB3.0

External interface

-

-

-

-

C port

-

Size mm²

70x46.5x68.5

56.5x43x41.5

70x46.5x68.5

56.5x43x41.5

56.5x43x41.5

70x46.5x68.5

weight

about240g

about120g

about240g

about120g

about120g

about240g

 


 

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