UHR Ultra-high High resolution wavefront sensor

The BOJIONG UHR Ultra-high High resolution wavefront sensor utilizes patented random coding four-wave diffraction technology to facilitate single-channel wavefront self-interference at the rear image plane location. This sensor demands minimal coherence from the light source and eliminates the need for phase shifting, allowing standard imaging systems to perform interference measurements. It is characterized by its ultra-high vibration resistance and stability, achieving nanometer-level precision measurements without the requirement for a vibration isolation platform. When compared to microlens array Hartmann sensors, the BOJIONG UHR Ultra-high High resolution wavefront sensor offers a greater number of phase points, a broader adaptive bandwidth, a wider dynamic range, and a more cost-effective solution.

Ultra High Resolution Four-wave Interferometric Sensor Specification：

Feature Of Ultra High Resolution Four-wave Interferometric Sensor：

◆Broad spectrum 400nm~1100nm band

◆2nm RMS high phase resolution

◆Ultra-high resolution of 512×512 (262144) phase points

◆Single-channel light self-interference, no reference light required

◆ultra-high vibration resistance, no need for optical vibration isolation

◆Just like imaging, easy and fast optical path construction

◆Supports collimated beams and large NA converged beams

Application Of Ultra High Resolution Four-wave Interferometric Sensor：

ThisBOJIONG Ultra High Resolution Four-wave Interferometric Sensor used in laser beam wavefront detection, adaptive optics, surface shape measurement, optical system calibration, optical window detection, optical plane, spherical surface shape measurement, surface roughness detection.

High Resolution Four-wave Interferometric Sensor Details

Developed by a team of professors from Zhejiang University and Nanyang Technological University of Singapore, the BOJIONG UHR Ultra-high High resolution wavefront sensor harnesses domestic patented technology to merge diffraction and interference for achieving four-wave transverse shear interference. This sensor is known for its exceptional detection sensitivity and vibration resistance, enabling real-time, high-speed dynamic interferometry without the need for vibration isolation, and it surpasses 10 frames per second in real-time measurement frame rate.

The FIS4 sensor, part of this system, spans a measurement range from 200nm to 15μm and boasts an ultra-high phase resolution of 512×512, equating to 260,000 phase points. It delivers measurement repeatability that is better than 1/1000λ (RMS) and possesses a sensitivity of 2nm. This sensor is well-suited for applications such as laser beam quality analysis, plasma flow field detection, real-time high-speed flow field distribution measurement, optical system image quality evaluation, microscopic profile measurement, and quantitative phase imaging of biological cells.