The high-resolution four-wave interferometric sensor is a highly efficient interferometric measurement tool specifically tailored for industrial applications, scientific research, and national defense sectors.
With its outstanding performance, this sensor offers a high resolution of 300×300 (90,000) phase points and a wide spectral response range of 400-1100nm, ensuring precision and reliability in various optical measurement scenarios.
Its unique technical features include the use of patented random coded four-wave diffraction technology, which allows the sensor to achieve self-interference in a single measured wavefront and to produce interference at the rear image plane position, without the need for complex phase-shifting techniques.
Moreover, BOJIONG's sensor is capable of displaying 3D results in full resolution at 10 frames per second in real-time, suitable for laser beam wavefront detection, adaptive optical systems, optical system calibration, optical window inspection, as well as measurements of optical plane and spherical shapes, including surface roughness and micro-profile detection.
With its easy operation, ultra-high vibration resistance, and stability, this sensor from BOJIONG provides an ideal wavefront sensing measurement solution, achieving nanometer-level precision measurements without the need for vibration isolation, significantly enhancing measurement efficiency and accuracy.
Wavelength range |
400nm~1100nm |
Target size |
7.07mm×7.07mm |
Spatial resolution |
23.6μm |
Image pixel |
2048×2048 |
Phase output resolution |
300×300(90000pixel) |
Phase resolution |
<2nmRMS |
Absolute accuracy |
10nmRMS |
Dynamic range |
110μm(150λ) |
Sampling rate |
24fps |
Real-time processing speed |
10Hz(At full resolution) |
Interface type |
GIGE |
Dimension |
56.5mm×43mm×41.5mm |
Weight |
about 120g |
◆Achieve simple and fast interference light path construction
◆Supports collimated beams and large NA converged beams
◆High resolution of 300×300 (90000) phase points
◆Single-channel light self-interference, no reference mirror required
◆Broad spectrum 400nm~1100nm band
◆2nm RMS high phase resolution
◆ultra-high vibration resistance, no need for optical vibration isolation
This BOJIONGHigh Resolution Four-wave Interferometric Sensor used in laser beam wavefront detection, adaptive optics, surface shape measurement, optical system calibration, optical window detection, optical plane, spherical surface shape measurement, surface roughness detection
laser beam wavefront detection |
Optical planar surface shape measurement |
Optical spherical surface shape measurement |
Aberration measurement of optical systems |
Optical window piece detection |
Measurement of lattice distribution inside the material |
Adaptive optics - wavefront detection response in Zernike mode |
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BOJIONG High Resolution Four-wave Interferometric Sensor developed by a team of professors from Zhejiang University and Nanyang Technological University of Singapore, with domestic patented technology, it combines diffraction and interference to achieve a common four-wave transverse shear interference, with superior detection sensitivity and anti-vibration performance, and can realize real-time and high-speed dynamic interferometry without vibration isolation. The real-time measurement shows a frame rate of more than 10 frames.
At the same time, the FIS4 sensor has an ultra-high phase resolution of 512×512 (260,000 phase points), the measurement band covers 200nm~15μm, the measurement sensitivity reaches 2nm, and the measurement repeatability is better than 1/1000λ (RMS). It can be used for laser beam quality analysis, plasma flow field detection, real-time measurement of high-speed flow field distribution, image quality evaluation of optical system, microscopic profile measurement and quantitative phase imaging of biological cells.
FIS4 Technical parameters of each series of products |
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Product |
FIS4-UV |
FIS4-HR |
FIS4-UHR |
FIS4-HS |
FIS4-Cell |
FIS4-NIR |
Wavelength range |
200~450nm |
400~1100nm |
400~1100nm |
400~1100nm |
400~1100nm |
900~1200nm |
Target size mm² |
13.3×13.3 |
7.07×7.07 |
13.3×13.3 |
10.24×10.24 |
7.07×7.07 |
13.3×13.3 |
Spatial resolution |
26μm |
23.6μm |
26μm |
24.4μm |
23.6μm |
26μm |
Image pixel |
- |
2048×2048 |
- |
- |
2048×2048 |
- |
Phase output resolution |
512×512 (262144pixel) |
300×300(90000pixel) |
512×512(262144pixel) |
420×420(176400pixel) |
300×300(90000pixel) |
512×512(262144pixel) |
Phase resolution |
<2nmRMS |
<2nmRMS |
<2nmRMS |
<2nmRMS |
<2nmRMS |
<2nmRMS |
Absolute accuracy |
10nmRMS |
10nmRMS |
15nmRMS |
10nmRMS |
10nmRMS |
15nmRMS |
Dynamic range |
90μm (256λ) |
110μm (150λ) |
162μm (256λ) |
132μm (210λ) |
110μm (150λ) |
270μm (256λ) |
Sampling rate |
32fps |
24fps |
45fps |
107fps |
24fps |
45fps |
Real-time processing speed |
10Hz (Full resolution) |
10Hz (Full resolution) |
10Hz (Full resolution) |
10Hz (Full resolution)Supports delayed batch processing |
10Hz (Full resolution) |
10Hz (Full resolution) |
Interface type |
USB3.0 |
GIGE |
USB3.0 |
GIGE |
GIGE |
USB3.0 |
External interface |
- |
- |
- |
- |
C port |
- |
Size mm² |
70x46.5x68.5 |
56.5x43x41.5 |
70x46.5x68.5 |
56.5x43x41.5 |
56.5x43x41.5 |
70x46.5x68.5 |
weight |
about240g |
about120g |
about240g |
about120g |
about120g |
about240g |
SID4 HR Very High resolution wavefront sensor_ Laser and optics measurement _ BOJIONG - BOJIONG
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No. 578 Yingkou Road, Yangpu District, Shanghai, China
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