The BOJIONG HR High Resolution wavefront sensor employs patented random coded four-wave diffraction technology to enable self-interference ahead of a single measured wavefront, with interference occurring at the rear image plane position. This sensor can achieve interference measurements using a standard imaging system, which demands minimal coherence from the light source and eliminates the need for phase shifting. It exhibits extraordinary vibration resistance and stability, facilitating nanometer-level precision measurements without the need for vibration isolation. In comparison to microlens array Hartman sensors, the BOJIONG HR High Resolution wavefront sensor offers a higher resolution of phase points, a broader adaptable bandwidth, a larger dynamic range, and a more favorable cost-performance ratio.
Wavelength range |
400nm~1100nm |
Target size |
7.07mm×7.07mm |
Spatial resolution |
23.6μm |
Image pixel |
2048×2048 |
Phase output resolution |
300×300(90000pixel) |
Phase resolution |
<2nmRMS |
Absolute accuracy |
10nmRMS |
Dynamic range |
110μm(150λ) |
Sampling rate |
24fps |
Real-time processing speed |
10Hz(At full resolution) |
Interface type |
GIGE |
Dimension |
56.5mm×43mm×41.5mm |
Weight |
about 120g |
◆Achieve simple and fast interference light path construction
◆Supports collimated beams and large NA converged beams
◆High resolution of 300×300 (90000) phase points
◆Single-channel light self-interference, no reference mirror required
◆Broad spectrum 400nm~1100nm band
◆2nm RMS high phase resolution
◆ultra-high vibration resistance, no need for optical vibration isolation
This BOJIONGHigh Resolution Four-wave Interferometric Sensor used in laser beam wavefront detection, adaptive optics, surface shape measurement, optical system calibration, optical window detection, optical plane, spherical surface shape measurement, surface roughness detection
laser beam wavefront detection |
Optical planar surface shape measurement |
Optical spherical surface shape measurement |
Aberration measurement of optical systems |
Optical window piece detection |
Measurement of lattice distribution inside the material |
Adaptive optics - wavefront detection response in Zernike mode |
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Developed by a collaboration of professors from Zhejiang University and Nanyang Technological University of Singapore, the BOJIONG HR High resolution wavefront sensor leverages domestic patented technology to merge diffraction and interference for achieving standard four-wave transverse shear interference. This sensor excels in detection sensitivity and anti-vibration capabilities, enabling real-time and high-speed dynamic interferometry without the need for vibration isolation, with a frame rate exceeding 10 frames for real-time measurements.
The FIS4 sensor within this system boasts an ultra-high phase resolution of 512×512, amounting to 260,000 phase points. It has a measurement range from 200nm to 15μm, a sensitivity of 2nm, and a repeatability that is superior to 1/1000λ (RMS). This advanced sensor is versatile for applications such as laser beam quality analysis, plasma flow field detection, real-time high-speed flow field distribution measurement, optical system image quality assessment, microscopic profile measurement, and quantitative phase imaging of biological cells.
Address
No. 578 Yingkou Road, Yangpu District, Shanghai, China
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