FlS4 high-resolution wavefront sensor 400-1100nm

FIS4 High-resolution wavefront sensor 400-1100nm

The Bojiong FIS4 High-resolution wavefront sensor 400-1100nm features 300x300 high-resolution phase detection points and a high-performance computational core (with measurement accuracy up to 2nm RMS), providing real-time wavefront data at full resolution at 10 frames per second. Its revolutionary common-path interferometry design ensures stable operation even in high-vibration environments without the need for vibration isolation. Its domestically developed randomly coded grating and powerful reconstruction algorithm ensure excellent interference resistance, precise measurement performance, and broad industrial applicability.

Bojiong FIS4 High-resolution wavefront sensor 400-1100nm Introduction

The Bojiong FIS4 High-resolution wavefront sensor 400-1100nm is our company's latest high-precision optical inspection product. It complies with ISO 9001 and China National Institute of Metrology (NIM) certification standards and comes with a one-year warranty. The FIS4 High-resolution wavefront sensor 400-1100nm utilizes common-path interferometry and a real-time wavefront reconstruction algorithm, eliminating the need for phase shifting and offering exceptional vibration resistance. Designed to meet the most stringent scientific research and industrial inspection requirements, it offers plug-and-play operation and simple maintenance.

Bojiong FIS4 High-resolution wavefront sensor 400-1100nm Parameter (Specification)

Bojiong FIS4 High-resolution wavefront sensor 400-1100nm Feature And Application

Since 2006，Professor Yang Yongying's team at Zhejiang University has launched the wide-spectrum FIS4 series wavefront sensors after 17 years of research and development, using common-path design and real-time wavefront reconstruction algorithms.

·Real-time detection of wavefront data is possible without the need for a vibration

isolation platform.

·Sensitivity can reach 2nm RMS.

·Single optical path design eliminates the need for reference light, enabling plug-and-play operation.

·Size is only the size of a fist.

This high-resolution wavefront sensor is designed for convenient interferometry in industry, scientific research, and national defense. With a high resolution of 300×300 (90,000) phase points, a wide spectral response from 400 to 1100 nm, and 10 frames of real-time 3D display at full resolution, it provides an ideal wavefront sensing measurement tool for applications such as beam wavefront measurement, adaptive optics, optical system calibration, optical window inspection, optical flat and spherical surface shape measurement, surface roughness, and surface micro-profile inspection.

Bojiong FIS4 High-resolution wavefront sensor 400-1100nm Application

Bojiong FIS4 High-resolution wavefront sensor 400-1100nm Details

The FIS4 wavefront sensor utilizes patented random-coded four-wave diffraction technology to achieve self-interference of a single measured wavefront, generating interference at the rear image plane. It requires minimal light source coherence and eliminates the need for phase shifting, enabling interferometric measurements using standard imaging systems. It offers exceptional vibration resistance and stability, achieving nanometer-level precision without the need for vibration isolation. Compared to microlens array Hartmann sensors, it boasts more high-resolution phase points, a wider wavelength range, a greater dynamic range, and a superior price-performance ratio.

Fig.1.Phase imaging principle based on four-wave lateral shearing interference using randomly coded hybrid grating (REHG)

Fig.2.Least square wavefront reconstruction from four-wave lateral shearing interferogram

The FIS4 wavefront sensor, due to its unique advantages such as compactness, robustness, high temporal resolution, and compatibility with existing microscopy systems, has become a powerful and versatile tool with a wide range of applications in research and industry. Initially used for traditional optical shop floor inspection, including optical component testing, laser beam evaluation, and adaptive optics, its applications have since expanded to include biomedical imaging, nanoparticle positioning, metasurface characterization, and temperature gradient characterization.

The FIS4 wavefront sensor's compact design makes it easy to integrate into existing microscopy systems, while its robustness is demonstrated by its ability to maintain precise interferometric sensitivity even in high-vibration environments. Furthermore, the FIS4 wavefront sensor is capable of single-shot measurements, enabling the capture of fast dynamic processes. In biomedical research, the FIS4 wavefront sensor has been used for label-free, high-resolution, real-time imaging of a variety of living cells, such as COS-7, HT1080 cells, RPE cells, CHO cells, HEK cells, and neurons.

The FIS4 wavefront sensor has also been used for phase-delay imaging, providing strong contrast for visualizing anisotropic tissue and subcellular structures such as collagen fibers and the cytoskeleton. This technology has also been extended to phase imaging in the X-ray, mid-wavelength infrared (MWIR), and long-wavelength infrared (LWIR) regions, further demonstrating its potential for interdisciplinary applications. Furthermore, recent research using the FIS4 wavefront sensor has extensively applied wavefront sensing technology to the characterization of metasurfaces and two-dimensional materials, demonstrating its diverse uses and potential value in optics and materials science.