Bojiong (Shanghai) Precision Machinery Technology Co., Ltd
Bojiong (Shanghai) Precision Machinery Technology Co., Ltd
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Near-Infrared Wavefront Sensor
  • Near-Infrared Wavefront SensorNear-Infrared Wavefront Sensor

Near-Infrared Wavefront Sensor

The Near-Infrared Wavefront Sensor, specialized in high-precision wavefront measurements within the 900-nanometer to 1200-nanometer wavelength range, provides clients with accurate solutions for optical performance measurement and analysis, contributing to the enhancement of product quality and production efficiency. Over recent years, we have been expanding our production capabilities, strengthening our technical expertise, and establishing a solid corporate operational framework. We are sincerely looking forward to the opportunity to collaborate with you in the near future.


The Near-Infrared Wavefront Sensor with an impressive dynamic range of up to 270μm. It boasts exceptional vibration resistance and stability, enabling nanometer-level precision measurements without the need for vibration isolation. This instrument is suitable for measuring the internal lattice distribution of materials, as well as wavefront measurements for metasurfaces and hyperlenses. We will always adhere to the principle of "quality first, customer first," and we cordially invite customers to visit us for consultation.

 

Item Specification:

 

product name

Near-Infrared Wavefront Sensor

Wavelength range

900nm~1200nm

Target size

13.3mm×13.3mm

Spatial resolution

26μm

Sampling resolution

512×512(262144pixel)

Phase resolution

<2nmRMS

Absolute accuracy

15nmRMS

Dynamic range

270μm(256λ)

Sampling rate

45fps

Real-time processing speed

10Hz(Full resolution)

Interface type

USB3.0

Dimension

70mm×46.5mm×68.5mm

Weight

about 240g


Feature Of BOJIONG Near-Infrared Wavefront Sensor

 

 

 

◆Large dynamic range up to 270μm

◆2nm RMS high phase resolution

◆Ultra-high resolution of 512×512 (262144) phase points

◆Single-channel light self-interference, no reference light required

◆Broad spectrum 900nm~1200nm band

◆Extremely strong anti-vibration performance, no need for optical vibration isolation

◆Just like imaging, easy and fast optical path construction

◆Supports collimated beams and large NA converged beams


 Application Of BOJIONG Near-Infrared Wavefront Sensor

 

This BOJIONG Near-Infrared Wavefront Sensor used in optical system aberration measurement, optical system calibration, material internal lattice distribution measurement, hypersurface, hyperlens wave front measurement

 

Example of aberration measurement of optical system

Sample measurement of lattice distribution inside a material

Optical system calibration measurement examples

Example of metasurface wavefront measurement

Example of hyperlens wavefront measurement

 

 

 

BOJIONG Near-Infrared Wavefront Sensor Details

 

BOJIONG Near-Infrared Wavefront Sensor developed by a team of professors from Zhejiang University and Nanyang Technological University of Singapore, with domestic patented technology, it combines diffraction and interference to achieve a common four-wave transverse shear interference, with superior detection sensitivity and anti-vibration performance, and can realize real-time and high-speed dynamic interferometry without vibration isolation. The real-time measurement shows a frame rate of more than 10 frames. At the same time, the FIS4 sensor has an ultra-high phase resolution of 512×512 (260,000 phase points), the measurement band covers 200nm~15μm, the measurement sensitivity reaches 2nm, and the measurement repeatability is better than 1/1000λ (RMS). It can be used for laser beam quality analysis, plasma flow field detection, real-time measurement of high-speed flow field distribution, image quality evaluation of optical system, microscopic profile measurement and quantitative phase imaging of biological cells.

 

FIS4 Technical parameters of each series of products

 

Product

FIS4-UV

FIS4-HR

FIS4-UHR

FIS4-HS

FIS4-Cell

FIS4-NIR

Wavelength range

200~450nm

400~1100nm

400~1100nm

400~1100nm

400~1100nm

900~1200nm

Target size mm²

13.3×13.3

7.07×7.07

13.3×13.3

10.24×10.24

7.07×7.07

13.3×13.3

Spatial resolution

26μm

23.6μm

26μm

24.4μm

23.6μm

26μm

Image pixel

-

2048×2048

-

-

2048×2048

-

Phase output resolution

512×512

(262144pixel)

300×300(90000pixel)

512×512(262144pixel)

420×420(176400pixel)

300×300(90000pixel)

512×512(262144pixel)

Phase resolution

<2nmRMS

<2nmRMS

<2nmRMS

<2nmRMS

<2nmRMS

<2nmRMS

Absolute accuracy

10nmRMS

10nmRMS

15nmRMS

10nmRMS

10nmRMS

15nmRMS

Dynamic range

90μm

(256λ)

110μm

(150λ)

162μm

(256λ)

132μm

(210λ)

110μm

(150λ)

270μm

(256λ)

Sampling rate

32fps

24fps

45fps

107fps

24fps

45fps

Real-time processing speed

10Hz

(Full resolution)

10Hz

(Full resolution)

10Hz

(Full resolution)

10Hz

(Full resolution)Supports delayed batch processing

10Hz

(Full resolution)

10Hz

(Full resolution)

Interface type

USB3.0

GIGE

USB3.0

GIGE

GIGE

USB3.0

External interface

-

-

-

-

C port

-

Size mm²

70x46.5x68.5

56.5x43x41.5

70x46.5x68.5

56.5x43x41.5

56.5x43x41.5

70x46.5x68.5

weight

about240g

about120g

about240g

about120g

about120g

about240g

 


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