The BOJIONG NIR Cost-effective wavefront sensor integrates patented random coded four-wave diffraction technology with an infrared camera, enabling interference at the rear image plane position. This setup allows standard imaging systems to perform interference measurements with exceptional vibration resistance and stability, reaching nanometer-level precision without requiring vibration isolation. The sensor demands minimal coherence from the light source and eliminates the need for phase shifting.
product name |
Near-Infrared Four-wave Interferometric Sensor |
Wavelength range |
900nm~1200nm |
Target size |
12mm×12mm |
Spatial resolution |
23.4μm |
Sampling resolution |
512×512(262144pixel) |
Phase resolution |
<2nmRMS |
Absolute accuracy |
15nmRMS |
Dynamic range |
270μm(256λ) |
Sampling rate |
32fps |
Real-time processing speed |
7Hz(Full resolution) |
Interface type |
USB3.0 |
Dimension |
70mm×46.5mm×68.5mm |
Weight |
about 240g |
◆Ultra-high resolution of 512×512 (262144) phase points
◆Broad spectrum 900nm~1200nm band
◆Single-channel light self-interference, no reference light required
◆2nm RMS high phase resolution
◆Large dynamic range up to 270μm
◆Just like imaging, easy and fast optical path construction
◆Extremely strong anti-vibration performance, no need for optical vibration isolation
◆Supports collimated beams and large NA converged beams
This BOJIONG Near-Infrared Four-wave Interferometric Sensor used in optical system aberration measurement, optical system calibration, material internal lattice distribution measurement, hypersurface, hyperlens wave front measurement
Example of aberration measurement of optical system |
Sample measurement of lattice distribution inside a material |
Optical system calibration measurement examples |
Example of metasurface wavefront measurement
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Example of hyperlens wavefront measurement
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The BOJIONG NIR Cost-effective wavefront sensor, a product of the collaborative efforts between professors from Zhejiang University and Nanyang Technological University of Singapore, incorporates domestic patented technology that unifies diffraction and interference for achieving standard four-wave transverse shear interference. This sensor excels in detection sensitivity and anti-vibration capabilities, enabling real-time and high-speed dynamic interferometry without the need for vibration isolation, with a frame rate exceeding 10 frames for real-time measurements.
Moreover, the FIS4 sensor within this setup spans a measurement range from 200 nanometers to 15 micrometers, featuring an ultra-high phase resolution of 512×512 (260,000 phase points), measurement repeatability superior to 1/1000λ (RMS), and a sensitivity of 2 nanometers. It is versatile for applications including laser beam quality analysis, plasma flow field detection, real-time high-speed flow field distribution measurement, optical system image quality evaluation, microscopic profile measurement, and quantitative phase imaging of biological cells.
Address
No. 578 Yingkou Road, Yangpu District, Shanghai, China
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