FIS4 ultra-high-resolution wavefront sensor 400-900nm

FIS4 ultra-high-resolution wavefront sensor 400-900nm 

The Bojiong FIS4 UHR wavefront sensor 400-900nm utilizes innovative four-wave lateral shearing interferometry technology. With an ultra-high density of 512×512 (over 260,000) phase detection points, it achieves nanometer-level wavefront resolution. The wavefront sensor maintains 2nm RMS measurement accuracy in standard environments without vibration isolation and outputs a full suite of optical specifications, including Zernike coefficients, PSF, and MTF, at full resolution at 5 frames per second. Leveraging a domestically produced random-coded grating and adaptive solution algorithm, it operates stably in complex industrial environments, including those characterized by vibration and temperature fluctuations. It provides a highly reliable wavefront measurement solution for ultra-precision manufacturing, optoelectronic system assembly, and cutting-edge scientific research.

Bojiong FIS4 UHR wavefront sensor 400-900nm Introduction

The FIS4 ultra-high-resolution wavefront sensor 400-900nm is our company's next-generation flagship optical measurement instrument. It holds ISO 9001 quality management system certification and is traceable to the China National Institute of Metrology (NIM). It comes with a one-year warranty. This sensor utilizes a proprietary common-path interferometer optical system and real-time wavefront solution architecture, eliminating the need for phase shifting or reference mirrors. It can achieve stable 512×512 ultra-high-resolution wavefront measurements even in high-vibration environments.

With its 2 nm RMS ultra-high precision, ≥160 μm wide dynamic range, and 5 frames/second full-parameter real-time output capability, the FIS4 UHR wavefront sensor can accurately capture transient wavefront details and high-order aberrations. It is widely applicable to fields such as laser beam diagnosis, free-form surface inspection, adaptive optics, and ultra-precision manufacturing. It truly achieves "start-up measurement without vibration isolation," greatly improving the efficiency and reliability of high-precision optical inspection.

Bojiong FIS4 UHR wavefront sensor 400-900nm Parameter (Specification)

Bojiong FIS4 UHR wavefront sensor 400-900nm Feature And Application

Since 2006，Professor Yang Yongying's team at Zhejiang University has launched the wide-spectrum FIS4 series wavefront sensors after 17 years of research and development, using common-path design and real-time wavefront reconstruction algorithms.

·Single optical path design eliminates the need for reference light, enabling plug-and-play operation.

·Real-time detection of wavefront data is possible without the need for a vibration

isolation platform.

·Sensitivity can reach 2nm RMS.

·Resolution reaches 512×512.

·Size is only the size of a fist.

 This FIS4 ultra-high-resolution wavefront sensor 400-900nm is specifically developed to assist scientific research and high-precision industrial scenarios. Its ultra-high resolution can detect more wavefront details of the object under test. It features an ultra-high resolution of 512×512 (262,144) phase points, a wide spectral response of 400-900nm, and a 5-frame full-resolution real-time 3D display. It provides an ideal wavefront sensing measurement tool for laser beam wavefront detection, adaptive optics, plane surface measurement, optical system calibration, optical window detection, optical spherical surface measurement, surface roughness detection, and surface micro-profiling.

Bojiong  FIS4 UHR wavefront sensor 400-900nm Application

Bojiong FIS4 UHR wavefront sensor 400-900nm Details

The FIS4 ultra-high-resolution wavefront sensor 400-900nm utilizes patented, independently developed, randomly coded four-wave diffraction technology, achieving self-interference of the measured wavefront using a single-path light source. This interference process occurs in the rear image plane. This technology significantly reduces the requirements for light source coherence, eliminating the need for any phase shifters and enabling high-precision interferometric measurements with conventional imaging systems. The product exhibits exceptional resistance to environmental vibrations and ultra-high operational stability, achieving nanometer-level measurement accuracy without the need for a vibration isolation base. Compared to traditional microlens array Hartmann sensors, the FIS4 offers significant advantages: higher-density phase point acquisition, wider spectral response range, and a greater dynamic measurement range, all while offering superior overall cost-performance. With its innovative technical architecture, the FIS4 wavefront sensor redefines the standard for high-precision optical measurement, providing a more reliable and cost-effective advanced solution for scientific research and industrial testing.

Fig.1.Phase imaging principle based on four-wave lateral shearing interference using randomly coded hybrid grating (REHG)

Fig.2.Least square wavefront reconstruction from four-wave lateral shearing interferogram

The FIS4 wavefront sensor, with its compact design, demonstrates great convenience when integrated with existing microscopy systems, enabling easy adaptation and collaborative operation. Meanwhile, it possesses excellent robustness, and even in relatively harsh environments such as high vibration, it can still accurately maintain interference sensitivity, ensuring the accuracy and reliability of measurement data.

It is worth mentioning that the FIS4 wavefront sensor supports single-shot measurement, a feature that allows it to efficiently capture rapid dynamic processes and provide strong data support for relevant research.

In the field of biomedical research, the FIS4 wavefront sensor has wide and important applications. It can achieve label-free, high-resolution, and real-time imaging of various living cells such as COS-7, HT1080 cells, RPE cells, CHO cells, HEK cells, and neurons, providing clear and highly valuable imaging data for in-depth research on cellular-level physiological mechanisms and other studies.In addition, in terms of phase delay imaging, the FIS4 wavefront sensor also performs excellently, providing strong contrast to clearly visualize anisotropic tissues and subcellular structures, such as Collagen fibres and cytoskeletons, helping researchers better observe and analyze microscopic structural Traits.

Not only that, this technology has been further extended to the field of phase imaging in the X-ray, Mid-wavelength Infrared (MWIR) and Long-wavelength Infrared (LWIR) regions, fully demonstrating its great potential in interdisciplinary applications and opening up new ideas and methods for multidisciplinary cross research.

Moreover, in recent studies, the wavefront sensing technology of the FIS4 wavefront sensor has also been widely used in the characterization of metasurfaces and two-dimensional materials, which undoubtedly highlights its many practical values and potential important significance in the fields of optics and materials science, and provides a powerful technical means for the further development of related fields.